✦ LIBER ✦
Reliability assessment of beam-lead sealed-junction integrated circuits in polymer sealed packages : K. B. Lasch, W. N. Schaitter and R. Ilgendritz. Proc. Electron. Components Conf. Arlington, Va., May 16–18, 1977. p. 429
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 134 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0026-2714
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