๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Factors limiting the measurement of residual stresses in thin films by nanoindentation

โœ Scribed by C.M. Lepienski; G.M. Pharr; Y.J. Park; T.R. Watkins; A. Misra; X. Zhang

Book ID
114085747
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
360 KB
Volume
447-448
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

The residual stress-induced buckling of
The residual stress-induced buckling of annular thin plates and its application in residual stress measurement of thin films
โœ Da-Yong Qiao; Wei-Zheng Yuan; Yi-Ting Yu; Qing Liang; Zhi-Bo Ma; Xiao-Ying Li ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 878 KB

The buckling method is presently one of the most commonly used methods in residual stress measurement, but still suffers from the problem that an array of structures occupying a large die area is required. In this paper, the buckling characteristics of annular thin plates were investigated and a new