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Fabrication and electrical characterization of highly ordered copper nanowires

✍ Scribed by Gurmeet Singh Lotey; Sanjeev Kumar; N. K. Verma

Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
582 KB
Volume
2
Category
Article
ISSN
2190-5509

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## Abstract Ultra thin (8 nm) silicon nanowires have been fabricated by Atomic Force Microscopy (AFM) lithography on an insulator layer starting from Silicon On Insulator (SOI) substrates. Electrical measurements reveal a high sensitivity of the electron transport in these ultra thin wires to the c