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Extreme Value Analysis in Flash Memories for Dosimetry Applications

✍ Scribed by Savage, Mark W.; Gadlage, Matthew J.; Kay, Matthew; Ingalls, J. David; Duncan, Adam


Book ID
121466007
Publisher
IEEE
Year
2013
Tongue
English
Weight
880 KB
Volume
60
Category
Article
ISSN
0018-9499

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Aggressive scaling of Flash memory devices requires robust tunnel oxides to improve the cell performance while preserving the retention and endurance characteristics. In this context, reoxidation of the tunnel oxide has recently [2] been proposed as a promising technique. In this paper, we focus our