External electro-optic integrated circuit probing
β Scribed by J.F. Whitaker; J.A. Valdmanis; M.Y. Frankel; S. Gupta; J.M. Chwalek; G.A. Mourou
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 687 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0167-9317
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A new method, based on zero point of longitudinal electric ΓΏeld, was used to determine the spatial resolution of external electro-optic (EO) probing equipment. Considering the di raction of Gauss beam, the result of external EO probing was simulated which was in accordance with the experiment. A spa
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