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Research of spatial resolution in external electro-optic probing

✍ Scribed by Hongbo Zhang; Rui Wang; Kaixin Chen; Han Yang; Daming Zhang; Maobin Yi; Guoquan Wang; Zhenchang Ma


Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
100 KB
Volume
34
Category
Article
ISSN
0030-3992

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✦ Synopsis


A new method, based on zero point of longitudinal electric ΓΏeld, was used to determine the spatial resolution of external electro-optic (EO) probing equipment. Considering the di raction of Gauss beam, the result of external EO probing was simulated which was in accordance with the experiment. A spatial resolution Β‘ 1 m was demonstrated initially in our equipment using 650 nm laser diode as probe beam and semi-insulating GaP as probe tip.


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A new external electro-optic probing technology has been first demonstrated using a poling electro-optic (EO) polymer film, spincoated on 20 nm thick grounding perspective aluminum layer which sputtered on a piece of ITO glass Γ°1000 mm Γ‚ 1000 mm Γ‚ 80 mmÞ as a probe tip, the aluminum layer which has