Research of spatial resolution in external electro-optic probing
β Scribed by Hongbo Zhang; Rui Wang; Kaixin Chen; Han Yang; Daming Zhang; Maobin Yi; Guoquan Wang; Zhenchang Ma
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 100 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0030-3992
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β¦ Synopsis
A new method, based on zero point of longitudinal electric ΓΏeld, was used to determine the spatial resolution of external electro-optic (EO) probing equipment. Considering the di raction of Gauss beam, the result of external EO probing was simulated which was in accordance with the experiment. A spatial resolution Β‘ 1 m was demonstrated initially in our equipment using 650 nm laser diode as probe beam and semi-insulating GaP as probe tip.
π SIMILAR VOLUMES
A new external electro-optic probing technology has been first demonstrated using a poling electro-optic (EO) polymer film, spincoated on 20 nm thick grounding perspective aluminum layer which sputtered on a piece of ITO glass Γ°1000 mm Γ 1000 mm Γ 80 mmΓ as a probe tip, the aluminum layer which has