𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Extension of spectroscopic ellipsometry to the far infrared

✍ Scribed by G. Dittmar; V. Offermann; M. Pohlen; P. Grosse

Book ID
107864229
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
501 KB
Volume
234
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Fourier-transform far-infrared spectrosc
Fourier-transform far-infrared spectroscopic ellipsometry for standoff material identification
✍ Michele Ortolani; Ulrich Schade πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 374 KB

The ellipsometry is an efficient method to determine the optical properties of matter. It has been largely employed with grating spectrometers in the visible, UV and near-infrared ranges for the characterization of thin films, surfaces and interfaces. In the mid-and far-infrared, where most substanc