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Far-infrared ellipsometry using synchrotron radiation

✍ Scribed by Kircher, J.; Henn, R.; Cardona, M.; Richards, P. L.; Williams, G. P.


Book ID
115395038
Publisher
Optical Society of America
Year
1997
Tongue
English
Weight
282 KB
Volume
14
Category
Article
ISSN
0740-3224

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