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Explaining the dependences of the hole and electron mobilities in Si inversion layers

✍ Scribed by Pirovano, A.; Lacaita, A.L.; Zandler, G.; Oberhuber, R.


Book ID
114538084
Publisher
IEEE
Year
2000
Tongue
English
Weight
168 KB
Volume
47
Category
Article
ISSN
0018-9383

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