๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

On the universal electric field dependence of the electron and hole effective mobility in MOS inversion layers

โœ Scribed by A. Emrani; G. Ghibaudo; F. Balestra


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
222 KB
Volume
37
Category
Article
ISSN
0038-1101

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES