Temperature dependence of effective mobility edge and inelastic scattering time in silicon MOS inversion layers in strong magnetic fields

✍ Scribed by J. Moriyama; S. Kawaji

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 199 KB
• Volume: 45
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(83)90164-3