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Experimental determination of finite inversion layer thickness in thin gate oxide MOSFETS

✍ Scribed by A. Toriumi; M. Yoshimi; M. Iwase; K. Taniguchi; C. Hamaguchi

Book ID: 104194588
Publisher: Elsevier Science
Year: 1986
Weight: 47 KB
Volume: 170
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(86)90577-3

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