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Transmission of electromagnetic radiation through an electron inversion layer of finite thickness in a metal-oxide-semiconductor (MOS) structure

✍ Scribed by R.F. O'Connell; G. Wallace

Publisher: Elsevier Science
Year: 1982
Weight: 326 KB
Volume: 115
Category: Article
ISSN: 0378-4363
DOI: 10.1016/0378-4363(82)90048-1

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📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 120 KB