Experimental demonstration and theory of a corrective to second breakdown in Si power transistors : Daniel Stolnitz, IEEE Trans.ED-13, No. 8/9, August/September (1966), p. 643

• Book ID: 103273058
• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 199 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90273-9