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Input power induced thermal effects related to transition time between avalanche and second breakdown in p-n silicon junctions : D. K. Ferry and A. A. Dougal, IEEE Trans.ED-13, No. 8/9, August/September (1966), p. 627


Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
95 KB
Volume
6
Category
Article
ISSN
0026-2714

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