Experimental demonstration and theory of a corrective to second breakdown in Si power transistors

✍ Scribed by Stolnitz, D.

• Book ID: 114589024
• Publisher: IEEE
• Year: 1966
• Tongue: English
• Weight: 960 KB
• Volume: ED-13
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1966.15752