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Experimental and theoretical noise analysis of microwave HEMTs

✍ Scribed by Joshin, K.; Asai, S.; Hirachi, Y.; Abe, M.


Book ID
114536184
Publisher
IEEE
Year
1989
Tongue
English
Weight
690 KB
Volume
36
Category
Article
ISSN
0018-9383

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## Abstract The simultaneous determination of noise, gain and scattering parameters through a computer‐driven noise figure measuring system allowed the rapid and accurate characterization of several samples of low noise HEMTs of the same family. From the measured parameters an equivalent circuit mo