Modeling of low-noise microwave HEMTS fo
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Caddemi, Alina ;Sannino, Mario
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Article
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1993
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John Wiley and Sons
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English
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## Abstract The simultaneous determination of noise, gain and scattering parameters through a computerβdriven noise figure measuring system allowed the rapid and accurate characterization of several samples of low noise HEMTs of the same family. From the measured parameters an equivalent circuit mo