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Exit angle dependence of penetration depth of backscattered electrons in the scanning electron microscope

✍ Scribed by Murata, K.

Publisher: John Wiley and Sons
Year: 1976
Tongue: English
Weight: 597 KB
Volume: 36
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210360121

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