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Excess noise measurement in In0.53Ga0.47As

✍ Scribed by Yu Ling Goh; Jo Shien Ng; Chee Hing Tan; Ng, W.K.; David, J.P.R.


Book ID
119802311
Publisher
IEEE
Year
2005
Tongue
English
Weight
131 KB
Volume
17
Category
Article
ISSN
1041-1135

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