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Measurement of InP/In0.53Ga0.47As and In0.53Ga0.47As/In0.52Al0.48As heterojunction band offsets by x‐ray photoemission spectroscopy

✍ Scribed by Waldrop, J. R.; Kraut, E. A.; Farley, C. W.; Grant, R. W.

No coin nor oath required. For personal study only.

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