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Examination of layered structures by total-reflection X-ray fluorescence analysis

✍ Scribed by J. Knoth; R. Bormann; R. Gutschke; C. Michaelsen; H. Schwenke

Book ID
113374881
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
586 KB
Volume
48
Category
Article
ISSN
0584-8547

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Surface analysis by total-reflection X-r
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✍ HΓ©ctor J. Sanchez; Carlos A. Perez; Roberto D. Perez; Marcelo Rubio πŸ“‚ Article πŸ“… 1996 πŸ› Elsevier Science 🌐 English βš– 523 KB

Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental