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Evolution of SiO2 matrix during the formation of Ge and Si nanocrystals by ion implantation

✍ Scribed by U. Serincan; S. Yerci; M. Kulakci; R. Turan


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
193 KB
Volume
239
Category
Article
ISSN
0168-583X

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