✦ LIBER ✦

Evaluation of the diffusion length in silicon diodes by means of the lateral IBIC technique

✍ Scribed by E Vittone; F Fizzotti; E Gargioni; R Lu; P Polesello; A LoGiudice; C Manfredotti; S Galassini; M Jaksic

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of charge collection profile

✍ F. Fizzotti; E. Colombo; A. Lo Giudice; C. Manfredotti; Z. Medunic; M. Jaksic; E 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 566 KB

Evaluation of the characteristics of sil

✍ Takeshi Ohshima; Kin Kiong Lee; Shinobu Onoda; Tomihiro Kamiya; Masakazu Oikawa; 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 253 KB

Measurement of minority carrier lifetime

✍ J. Müller; H. Bernt; H. Reichl 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 301 KB

Contactless nondestructive technique for

✍ White, J.C.; Unter, T.F.; Smith, J.G. 📂 Article 📅 1977 🏛 Institution of Electrical Engineers ⚖ 733 KB

Erratum: Contactless nondestructive tech

✍ White, J.C.; Unter, T.F.; Smith, J.G. 📂 Article 📅 1977 🏛 Institution of Electrical Engineers ⚖ 109 KB

Evaluation of cytostatic drug concentrat

✍ Porpaczy, P. ;Schmidbauer, C. P. ;Georgopoulos, A. ;Rameis, H. ;Endler, T. A. 📂 Article 📅 1983 🏛 Springer 🌐 English ⚖ 602 KB