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Evaluation of resistance of CMOS LSIC to the factor of absorbed dose under the pulsed radiation effect

โœ Scribed by A. V. Sogoyan


Book ID
110215477
Publisher
Springer
Year
2011
Tongue
English
Weight
490 KB
Volume
40
Category
Article
ISSN
1063-7397

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## Background and Objective: In recent years, clinical lowintensity laser therapy practice has used pulsed radiation, mainly from semiconductor lasers. Experimental works devoted to the study of relationships between biological and clinical effects and parameters of pulsed radiation are practicall