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Modeling of High-Dose-Rate Pulsed Radiation Effects in the Parasitic MOS Structures of CMOS LSI Circuits

✍ Scribed by A. Y. Nikiforov; A. V. Sogoyan


Book ID
111609440
Publisher
Springer
Year
2004
Tongue
English
Weight
107 KB
Volume
33
Category
Article
ISSN
1063-7397

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