✦ LIBER ✦

Evaluation of hot carrier degradation of N-channel MOSFET's with the charge pumping technique

✍ Scribed by P. Heremans; H. Maes; N. Saks

Book ID: 126706581
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 292 KB
Volume: 7
Category: Article
ISSN: 0741-3106
DOI: 10.1109/EDL.1986.26425

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Understanding of the hot carrier degrada

Understanding of the hot carrier degradation behaviour of MOSFET's by means of the charge pumping technique

✍ H.E. Maes; G. Groeseneken; P. Heremans; R. Bellens 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 482 KB

Use of the charge pumping technique to u

Use of the charge pumping technique to understand non-uniform n-channel MOSFET degradation

✍ F. Djahli; J.L. Autran; C. Plossu; B. Balland 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 260 KB

By using the charge pumping technique we have separated the interface state from the fixed charge effects when non-uniform MOSFET degradation is induced by hot-carrier injection under electrical stress. For n-channel MOSFETs we show that, after a hot-electron injection, hot-holes can also be injecte

Evaluation of channel hot carrier effect

Evaluation of channel hot carrier effects in n-MOS transistors at 77 K with the charge pumping technique

✍ P. Heremans; Y.-C. Sun; G. Groeseneken; H.E. Maes 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 306 KB

Evaluation of hot-carrier degradation of

Evaluation of hot-carrier degradation of n-channel MOSFETs at low gate bias

✍ Alan Meehan; Paula O'Sullivan; Paul Hurley; Alan Mathewson 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 304 KB

On the channel-length dependence of the

On the channel-length dependence of the hot-carrier degradation of n-channel MOSFETs

✍ R. Bellens; P. Heremans; G. Groeseneken; H. Maes 📂 Article 📅 1989 🏛 IEEE 🌐 English ⚖ 277 KB

Hot-carrier degradation behavior of N- a

Hot-carrier degradation behavior of N- and P-channel MOSFET's under dynamic operation conditions

✍ Bellens, R.; Groeseneken, G.; Heremans, P.; Maes, H.E. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 914 KB