✦ LIBER ✦

Evaluation of carrier distributions in a depletion region of semiconductor measured by a capacitance-voltage profile method

✍ Scribed by Yeo, Y. K.; Gainer, G. H.; Kim, Jong Hyun; Hengehold, R. L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of Diffusion in Semiconducto

✍ McAfee, K. B.; Shockley, W.; Sparks, M. 📂 Article 📅 1952 🏛 The American Physical Society 🌐 English ⚖ 342 KB

Multiphonon capture of charge carriers b

✍ M. A. Dem’yanenko; V. N. Ovsyuk; V. V. Shashkin 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 97 KB

A comprehensive method combining deep-de

✍ Kerber, M. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 544 KB

Characterization of charge carrier injec

✍ Weingarten, M. (author);Slawinski, M. (author);Urbain, F. (author);Fahle, D. (au 📂 Article 📅 2012 🏛 SPIE ⚖ 619 KB

A study of annealing effects on deep lev

✍ A.S. Bhuiyan; A. Martinez; D. Esteve 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 308 KB

Measurement of the surface recombination

✍ V. B. Akhmanaev; Yu. V. Lisyuk; Yu. V. Medvedev; A. S. Petrov 📂 Article 📅 1983 🏛 Springer 🌐 English ⚖ 402 KB