✦ LIBER ✦
A comprehensive method combining deep-depletion profiling and capacitance transients to evaluate energy and depth distribution of MOS bulk defects
✍ Scribed by Kerber, M.
- Book ID
- 114534528
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 544 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.