A study of annealing effects on deep level profile distributions in GaAs by capacitive methods

✍ Scribed by A.S. Bhuiyan; A. Martinez; D. Esteve

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 308 KB
• Volume: 162
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(88)90188-5