Evaluation and analysis of polished fused silica subsurface quality by the nanoindenter technique

✍ Scribed by Ma, Bin ;Shen, Zhengxiang ;He, Pengfei ;Sha, Fei ;Wang, Chunliang ;Wang, Bin ;Ji, Yiqin ;Liu, Huasong ;Li, Weihao ;Wang, Zhanshan

• Book ID: 115357014
• Publisher: The Optical Society
• Year: 2011
• Tongue: English
• Weight: 797 KB
• Volume: 50
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.50.00C279