✦ LIBER ✦

EUV reflectometry for thickness and density determination of thin film coatings

✍ Scribed by Döring, S.; Hertlein, F.; Bayer, A.; Mann, K.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ellipsometric Technique for Estimating t

✍ Baturin, A. S.; Bormashov, V. S.; Gavrilenko, V. P.; Zablotskii, A. B.; Zaitsev, 📂 Article 📅 2014 🏛 Springer US 🌐 English ⚖ 191 KB

Adhesion Measurement of Thin Films, Thic

✍ Zorll, U. 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 84 KB

Determination of thin film refractive in

✍ Nenkov, Milen ;Pencheva, Tamara 📂 Article 📅 2008 🏛 Walter de Gruyter GmbH 🌐 English ⚖ 675 KB

Thickness Measurement for Thin Films and

✍ H. C. Han; E. S. Mansueto 📂 Article 📅 1997 🏛 Springer 🌐 English ⚖ 666 KB

Quantitative measurement of film thickne

✍ B.P. Hichwa 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 373 KB

Symposium on adhesion measurement of thi

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 60 KB