Etching and structural changes of polyst
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A. Kondyurin; B.K. Gan; M.M.M. Bilek; K. Mizuno; D.R. McKenzie
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Article
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2006
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Elsevier Science
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English
โ 431 KB
Polystyrene films of 100 nm thickness were modified using plasma immersion ion implantation (PIII) with argon ions of energy 20 keV and fluences in the range 2 โข 10 14 -2 โข 10 16 ions cm ร2 . The structure and properties of the films were determined by ellipsometry and FTIR spectroscopy, as well as