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Etching and structural changes in nitrogen plasma immersion ion implanted polystyrene films

โœ Scribed by B.K. Gan; M.M.M. Bilek; A. Kondyurin; K. Mizuno; D.R. McKenzie


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
195 KB
Volume
247
Category
Article
ISSN
0168-583X

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Etching and structural changes of polyst
โœ A. Kondyurin; B.K. Gan; M.M.M. Bilek; K. Mizuno; D.R. McKenzie ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 431 KB

Polystyrene films of 100 nm thickness were modified using plasma immersion ion implantation (PIII) with argon ions of energy 20 keV and fluences in the range 2 โ€ข 10 14 -2 โ€ข 10 16 ions cm ร€2 . The structure and properties of the films were determined by ellipsometry and FTIR spectroscopy, as well as