β Scribed by Dr. C. Weibull
No coin nor oath required. For personal study only.
Carbon films or thin sections of plastic materials were introduced into the electron beam of an electron microscope and the fraction of electrons scattered enough not to reach the fluorescent screen was estimated by means of the exposure meter of the microscope. The values obtained showed that a simple relationship existed between the fraction of electrons scattered and the thickness of the sections (films) AS estimated with a microtome or otherwise. I n this way, film thicknesses between about 5 and 130 n m can rapidly be estimated.
However, when sectioned material is studied, areas free of embedded material must be present in the sections.
π SIMILAR VOLUMES
The problem of estimating the thickness and the optical constants of thin films using transmission data only is very challenging from the mathematical point of view and has a technological and an economic importance. In many cases it represents a very ill-conditioned inverse problem with many local-
## Abstract In any polymer blend system, the nature and thickness of the polymer interface can have a significant influence on the overall performance of the blend. Consequently, it is important to understand the nature of the interactions between the various blend components to effectively design