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992. Measurement of thickness of thin films used in electron microscopy: M Molcik, Jenna Mech Optika, 18 (1), 1973, 18–19, (in Czech)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 152 KB
Volume: 24
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(74)90660-5

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