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Estimate Threshold Voltage Shift in a-Si:H TFTs Under Increasing Bias Stress

โœ Scribed by Shou-En Liu; Chen-Pang Kung; Hou, J.


Book ID
114619262
Publisher
IEEE
Year
2009
Tongue
English
Weight
271 KB
Volume
56
Category
Article
ISSN
0018-9383

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