✦ LIBER ✦
An analytical method of evaluating variation of the threshold voltage shift caused by the negative-bias temperature stress in poly-Si TFTs
✍ Scribed by Maeda, S.; Maegawa, S.; Ipposhi, T.; Kuriyama, H.; Ashida, M.; Inoue, Y.; Miyoshi, H.; Yasuoka, A.
- Book ID
- 114537170
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 255 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.