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ESR line share study of amorphous centres in ion implanted silicon

✍ Scribed by Götz, G. ;Karthe, W. ;Schnabel, B. ;Sobolev, N.

Publisher: John Wiley and Sons
Year: 1978
Tongue: English
Weight: 202 KB
Volume: 50
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210500271

No coin nor oath required. For personal study only.

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