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ESD sensitivity and VLSI technology trends: thermal breakdown and dielectric breakdown

✍ Scribed by D.L. Lin

Publisher: Elsevier Science
Year: 1994
Tongue: French
Weight: 959 KB
Volume: 33
Category: Article
ISSN: 0304-3886
DOI: 10.1016/0304-3886(94)90034-5

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