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A study of the dielectric breakdown of thermally grown SiO2 by the self-quenching technique : D. Y. Yang, Walter C. Johnson and Murray A. Lampert. 13th Ann. Proc. Reliability Physics Symposium 1975. Nevada. p. 10


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
127 KB
Volume
15
Category
Article
ISSN
0026-2714

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