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[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry

✍ Scribed by Voldman, S.; Hui, D.; Young, D.; Williams, R.; Dreps, D.; Howard, J.; Sherony, M.; Assaderaghi, F.; Shahidi, G.

Book ID: 126677416
Publisher: ESD Assoc
Year: 2000
Weight: 1013 KB
Category: Article
ISBN-13: 9781585370184
DOI: 10.1109/EOSESD.2000.890024

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