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[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - ESD immunity in system designs, system field experiences and effects of PWB layout

✍ Scribed by Smith, D.C.; Nakauchi, E.

Book ID: 121263334
Publisher: ESD Assoc
Year: 2000
Weight: 639 KB
Category: Article
ISBN-13: 9781585370184
DOI: 10.1109/EOSESD.2000.890026

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