𝔖 Bobbio Scriptorium

✦ LIBER ✦

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Engineering the cascoded NMOS output buffer for maximum V/sub t1/

✍ Scribed by Miller, J.W.; Khazhinsky, M.G.; Weldon, J.C.

Book ID: 121705750
Publisher: ESD Assoc
Year: 2000
Weight: 882 KB
Category: Article
ISBN-13: 9781585370184
DOI: 10.1109/eosesd.2000.890090

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[ESD Assoc Electrical Overstress/Electro

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Electrostatic voltmeter and fieldmeter measurements on GMR recording heads

✍ Pritchard, D. 📂 Article 📅 2000 🏛 ESD Assoc ⚖ 388 KB

[ESD Assoc Electrical Overstress/Electro

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Limitations of the adiabatic model for ESD failure in GMR structures

✍ Granstrom, E.; Tabat, N. 📂 Article 📅 2000 🏛 ESD Assoc ⚖ 304 KB

[ESD Assoc Electrical Overstress/Electro

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry

✍ Voldman, S.; Hui, D.; Young, D.; Williams, R.; Dreps, D.; Howard, J.; Sherony, M 📂 Article 📅 2000 🏛 ESD Assoc ⚖ 1013 KB

[ESD Assoc Electrical Overstress/Electro

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Considerations for an HBM ESD standard for measuring and testing of magneto resistive heads

✍ Henry, L.G.; Wallash, A. 📂 Article 📅 2000 🏛 ESD Assoc ⚖ 442 KB

[ESD Assoc Electrical Overstress/Electro

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - ESD immunity in system designs, system field experiences and effects of PWB layout

✍ Smith, D.C.; Nakauchi, E. 📂 Article 📅 2000 🏛 ESD Assoc ⚖ 639 KB

[ESD Assoc Electrical Overstress/Electro

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Investigation of ESD transient EMI causing spurious clock track read transitions during servo-write

✍ Ber-Chin Yap, ; Patton, C.R. 📂 Article 📅 2000 🏛 ESD Assoc ⚖ 472 KB