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[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Comparison and correlation of ESD HBM (human body model) obtained between TLPG, wafer-level, and package-level tests

✍ Scribed by Lee, M.T.; Liu, C.H.; Chung-Chiang Lin, ; Jin-Tau Chou, ; Tang, H.T.H.; Chang, Y.J.; Fu, K.Y.

Book ID: 126642297
Publisher: ESD Assoc
Year: 2000
Weight: 343 KB
Category: Article
ISBN-13: 9781585370184
DOI: 10.1109/EOSESD.2000.890033

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