𝔖 Bobbio Scriptorium

✦ LIBER ✦

Equivalence of Radiation Particles for Permanent Damage in Semiconductor Devices

✍ Scribed by Brown, Richard P.

Book ID: 117927534
Publisher: IEEE
Year: 1963
Tongue: English
Weight: 731 KB
Volume: 10
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1963.4323304

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Annealing of Radiation and Electrostatic

Annealing of Radiation and Electrostatic-Discharge Damages in Semiconductor Devices

✍ M. I. Gorlov; D. A. Litvinenko 📂 Article 📅 2002 🏛 Springer 🌐 English ⚖ 147 KB

Investigation of radiation damage in a S

Investigation of radiation damage in a Si PIN photodiode for particle detection

✍ A. Simon; G. Kalinka; M. Jakšić; Ž. Pastuović; M. Novák; Á.Z. Kiss 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 482 KB

The use of ion scattering for the study

The use of ion scattering for the study of radiation damage in metals and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardment induced surface damage

✍ DG Armour 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 62 KB

The use og ion scattering for the study

The use og ion scattering for the study of radiation damage in metal and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardent induced surface damage: D G Armour, Vacuum, 32 (9), 1982, 573

📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 291 KB

[IEEE Proceedings IEEE/Cornell Conferenc

[IEEE Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits - Ithaca, NY, USA (1997.08.6-1997.08.6)] Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits CORNEL-97 - Parameter extraction technique for the small-signal equivalent circuit model of microwave silicon MOSFETs

✍ Seonghearn Lee, ; Hyun Kyu Yu, 📂 Article 📅 1997 🏛 IEEE ⚖ 550 KB