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Epitaxial growth of Si on GaP(100) and Si(111), monitored by soft X-ray reflection

โœ Scribed by M.P Bruijn; H Muller; J Verhoeven; M.J Van Der Wiel


Book ID
118985835
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
876 KB
Volume
154
Category
Article
ISSN
0039-6028

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