Studying natural oxide on the surface ofn-Si(111),n-Si(100), andp-Si(111) single crystal wafers by X-ray reflection spectroscopy

✍ Scribed by E. O. Filatova; A. A. Sokolov; E. Yu. Taracheva; I. V. Bagrov

• Book ID: 111450266
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2009
• Tongue: English
• Weight: 197 KB
• Volume: 35
• Category: Article
• ISSN: 1063-7850
• DOI: 10.1134/s1063785009010210