✦ LIBER ✦
Atomic depth distribution analysis of Ag and Au on Si(111) during epitaxial growth by total reflection angle X-ray spectroscopy
✍ Scribed by Toshiro Yamanaka; Akira Endo; Shozo Ino
- Publisher
- Elsevier Science
- Year
- 1993
- Weight
- 80 KB
- Volume
- 294
- Category
- Article
- ISSN
- 0167-2584
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