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Enhanced room temperature oxidation in silicon and porous silicon under 10 keV x-ray irradiation

✍ Scribed by Ryckman, Judson D.; Reed, Robert A.; Weller, Robert A.; Fleetwood, D. M.; Weiss, S. M.


Book ID
121801879
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
338 KB
Volume
108
Category
Article
ISSN
0021-8979

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