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Enhanced emission of Ge2+ secondary ions under N2+ bombardment

โœ Scribed by N Ray; P Rajasekar; SD Dey


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
394 KB
Volume
47
Category
Article
ISSN
0042-207X

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD